Czech J. Food Sci., 2003, 21(1):34-40 | DOI: 10.17221/3475-CJFS

Properties of thin metallic films for microwave susceptors

J. Česnek, J. Dobiáš, J. Houšová, J. Sedláček
1 Romill, s.r.o., Brno, Czech Republic
2 Department of Food Preservation and Meat Technology, Institute of Chemical Technology, Prague, Czech Republic
3 Food Research Institute Prague, Prague, Czech Republic
4 Department of Mechanics and Materials Science, Czech Technical University in Prague, Prague, Czech Republic

Thin Al films of varying thickness, i.e. 3 to 30 nm, were deposited onto polyethylene-terephthalate film by evaporation in the vacuum of 3 × 10-3 Pa. The dependence of DC (direct current) surface resistance on thickness was measured using a four-point method. The surface resistance exhibits the size effect in accordance with the Fuchs-Sondheimer theory. The microwave absorption properties of the prepared films of various metallization thickness were measured in a microwave field at the microwave power of 1.8 mW. The maximum microwave absorption at 2.45 GHz was found to occur in a layer of optical density of about 0.22.

Keywords: microwave susceptors; food packaging; optical density; DC surface resistance; microwave absorption

Published: February 28, 2003  Show citation

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Česnek J, Dobiáš J, Houšová J, Sedláček J. Properties of thin metallic films for microwave susceptors. Czech J. Food Sci. 2003;21(1):34-40. doi: 10.17221/3475-CJFS.
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